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THE EFFECT OF HOT CARRIER STRESS ON LOW NOISE AMPLIFIER RADIO FREQUENCY PERFORMANCE UNDER WEAK AND STRONG INVERSION

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Date Issued:
2006
Abstract/Description:
This thesis work is mainly focused on studying RF performance degradation of a low noise amplifier (LNA) circuit due to hot carrier effect (HCE) in both the weak and strong inversion regions. Since the figures of merit for the RF circuit characterization are gain, noise figure, input, and output matching, the LNA RF performance drift is evaluated in a Cadence SpectreRF simulator subject to these features. This thesis presents hot carrier induced degradation results of an LNA to show that the HCE phenomenon is one of the serious reliability issues in the aggressively scaled RF CMOS design, especially for long-term operation of these devices. The predicted degradation from simulation results can be used design reliable CMOS RF circuits.
Title: THE EFFECT OF HOT CARRIER STRESS ON LOW NOISE AMPLIFIER RADIO FREQUENCY PERFORMANCE UNDER WEAK AND STRONG INVERSION.
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Name(s): Shen, Lin, Author
Yuan, Jiann, Committee Chair
University of Central Florida, Degree Grantor
Type of Resource: text
Date Issued: 2006
Publisher: University of Central Florida
Language(s): English
Abstract/Description: This thesis work is mainly focused on studying RF performance degradation of a low noise amplifier (LNA) circuit due to hot carrier effect (HCE) in both the weak and strong inversion regions. Since the figures of merit for the RF circuit characterization are gain, noise figure, input, and output matching, the LNA RF performance drift is evaluated in a Cadence SpectreRF simulator subject to these features. This thesis presents hot carrier induced degradation results of an LNA to show that the HCE phenomenon is one of the serious reliability issues in the aggressively scaled RF CMOS design, especially for long-term operation of these devices. The predicted degradation from simulation results can be used design reliable CMOS RF circuits.
Identifier: CFE0000952 (IID), ucf:46763 (fedora)
Note(s): 2006-05-01
M.S.
Engineering and Computer Science, Department of Electrical and Computer Engineering
Masters
This record was generated from author submitted information.
Subject(s): radio frequency
low noise amplifier
hot carrier effect
Persistent Link to This Record: http://purl.flvc.org/ucf/fd/CFE0000952
Restrictions on Access: campus 2016-01-31
Host Institution: UCF

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