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Implementation of Optical Interferometry and Spectral Reflectometry for High Fidelity Thin Film Measurements

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Date Issued:
2017
Abstract/Description:
An in-house reflectometer/interferometer has been built to investigate the varying curvature and thickness profiles in the contact line region of air, acetone, iso-octane, ethanol, and water on various types of substrates. Light intensity measurements were obtained using our reflectometer/interferomter and then analyzed in MATLAB to produce thickness and curvature profiles. The apparatus is based on the principle of a reflectometer, consisting of different optical elements, probe, light source, and spectrometer. Our reflectometer/interferomter takes measurements in the UV-Vis-IR range (200nm-1000nm). This range is achieved by using a light source that has both a deuterium light (190nm-800nm), a tungsten halogen light (400nm-1100nm), a Metal-Core Printed Circuit Board LED (800nm-1000nm) and a Metal-Core Printed Circuit board cold white LED (400nm-800nm, 6500 K). A UV-VIS-IR spectrometer reads the light response after light is focused on the region of interest. Then a CCD camera (2448x2048) records the profiles for image analyzing interferometry. The readings were then validated based on results in the literature and studies with cylindrical lens samples.
Title: Implementation of Optical Interferometry and Spectral Reflectometry for High Fidelity Thin Film Measurements.
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Name(s): Arends-Rodriguez, Armando, Author
Putnam, Shawn, Committee Chair
Chow, Louis, Committee Member
Kauffman, Jeffrey, Committee Member
University of Central Florida, Degree Grantor
Type of Resource: text
Date Issued: 2017
Publisher: University of Central Florida
Language(s): English
Abstract/Description: An in-house reflectometer/interferometer has been built to investigate the varying curvature and thickness profiles in the contact line region of air, acetone, iso-octane, ethanol, and water on various types of substrates. Light intensity measurements were obtained using our reflectometer/interferomter and then analyzed in MATLAB to produce thickness and curvature profiles. The apparatus is based on the principle of a reflectometer, consisting of different optical elements, probe, light source, and spectrometer. Our reflectometer/interferomter takes measurements in the UV-Vis-IR range (200nm-1000nm). This range is achieved by using a light source that has both a deuterium light (190nm-800nm), a tungsten halogen light (400nm-1100nm), a Metal-Core Printed Circuit Board LED (800nm-1000nm) and a Metal-Core Printed Circuit board cold white LED (400nm-800nm, 6500 K). A UV-VIS-IR spectrometer reads the light response after light is focused on the region of interest. Then a CCD camera (2448x2048) records the profiles for image analyzing interferometry. The readings were then validated based on results in the literature and studies with cylindrical lens samples.
Identifier: CFE0006559 (IID), ucf:51328 (fedora)
Note(s): 2017-05-01
M.S.A.E.
Engineering and Computer Science, Mechanical and Aerospace Engineering
Masters
This record was generated from author submitted information.
Subject(s): Reflectometry -- interferometry -- thin films -- optics -- liquid films -- solid films -- curvature profile measurements
Persistent Link to This Record: http://purl.flvc.org/ucf/fd/CFE0006559
Restrictions on Access: campus 2018-05-15
Host Institution: UCF

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