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- Title
- CONTRIBUTIONS TO AUTOMATIC PARTICLE IDENTIFICATION IN ELECTRON MICROGRAPHS: ALGORITHMS, IMPLEMENTATION, AND APPLICATIONS.
- Creator
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Singh, Vivek, Marinescu, Dan, University of Central Florida
- Abstract / Description
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Three dimensional reconstruction of large macromolecules like viruses at resolutions below 8 \AA~ - 10 \AA~ requires a large set of projection images and the particle identification step becomes a bottleneck. Several automatic and semi-automatic particle detection algorithms have been developed along the years. We present a general technique designed to automatically identify the projection images of particles. The method utilizes Markov random field modelling of the projected images and...
Show moreThree dimensional reconstruction of large macromolecules like viruses at resolutions below 8 \AA~ - 10 \AA~ requires a large set of projection images and the particle identification step becomes a bottleneck. Several automatic and semi-automatic particle detection algorithms have been developed along the years. We present a general technique designed to automatically identify the projection images of particles. The method utilizes Markov random field modelling of the projected images and involves a preprocessing of electron micrographs followed by image segmentation and post processing for boxing of the particle projections. Due to the typically extensive computational requirements for extracting hundreds of thousands of particle projections, parallel processing becomes essential. We present parallel algorithms and load balancing schemes for our algorithms. The lack of a standard benchmark for relative performance analysis of particle identification algorithms has prompted us to develop a benchmark suite. Further, we present a collection of metrics for the relative performance analysis of particle identification algorithms on the micrograph images in the suite, and discuss the design of the benchmark suite.
Show less - Date Issued
- 2005
- Identifier
- CFE0000705, ucf:46610
- Format
- Document (PDF)
- PURL
- http://purl.flvc.org/ucf/fd/CFE0000705
- Title
- Transient Safe Operating Area (TSOA) for ESD applications.
- Creator
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Malobabic, Slavica, Liou, Juin, Shen, Zheng, Yuan, Jiann-Shiun, Vinson, James, University of Central Florida
- Abstract / Description
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A methodology to obtain design guidelines for gate oxide input pin protection and high voltage output pin protection in Electrostatic Discharge (ESD) time frame is developed through measurements and Technology Computer Aided Design (TCAD).A set of parameters based on transient measurements are used to define Transient Safe Operating Area (TSOA). The parameters are then used to assess effectiveness of protection devices for output and input pins.The methodology for input pins includes...
Show moreA methodology to obtain design guidelines for gate oxide input pin protection and high voltage output pin protection in Electrostatic Discharge (ESD) time frame is developed through measurements and Technology Computer Aided Design (TCAD).A set of parameters based on transient measurements are used to define Transient Safe Operating Area (TSOA). The parameters are then used to assess effectiveness of protection devices for output and input pins.The methodology for input pins includes establishing ESD design targets under Charged Device Model (CDM) type stress in low voltage MOS inputs.The methodology for output pins includes defining ESD design targets under Human Metal Model (HMM) type stress in high voltage Laterally Diffused MOS (LDMOS) outputs. First, the assessment of standalone LDMOS robustness is performed, followed by establishment of protection design guidelines. Secondly, standalone clamp HMM robustness is evaluated and a prediction methodology for HMM type stress is developed based on standardized testing. Finally, LDMOS and protection clamp parallel protection conditions are identified.
Show less - Date Issued
- 2012
- Identifier
- CFE0004405, ucf:49363
- Format
- Document (PDF)
- PURL
- http://purl.flvc.org/ucf/fd/CFE0004405
