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HOT CARRIER EFFECT ON LDMOS TRANSISTORS
STUDY OF OXIDE BREAKDOWN, HOT CARRIER AND NBTI EFFECTS ON MOS DEVICE AND CIRCUIT RELIABILITY
THE EFFECT OF HOT CARRIER STRESS ON LOW NOISE AMPLIFIER RADIO FREQUENCY PERFORMANCE UNDER WEAK AND STRONG INVERSION
INVESTIGATION AND TRADE STUDY ON HOT CARRIER RELIABILITY OF THE PHEMT FOR DC AND RF PERFORMANCE
MODELING AND SIMULATION OF LONG TERM DEGRADATION AND LIFETIME OF DEEP-SUBMICRON MOS DEVICE AND CIRCUIT
Adaptive Architectural Strategies for Resilient Energy-Aware Computing